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» CIM Meeting 2017

     

    The 18th International Metrology Congress (CIM) will be taking place from the 19th to 21st of September 2017 in Paris, France. As usual, the annual meeting will discuss research & development as well as the best practices for measurement in the industry. Specifically, this year’s meeting will examine:

    • Improvement of measurement, analysis and testing processes and control risks
    • Following the evolution of techniques, advances in R&D and discovering industrial applications
    • Exploring the exhibition showcasing innovations and solutions

    Registration and further information is available here.